KAMAKIRI X-stage is a compact desktop inspection system designed with high-performance line scan technology.
While being space-saving and easy to operate, it incorporates the same core algorithms used in full-scale inline systems, making it an ideal solution for R&D, pre-production evaluation, or as an entry model before inline system integration.
For large film applications, the stage size can be customized to support wide-format film inspection, allowing measurement of TD (transverse direction) distribution of films up to 1.5 meters wide in just around 5 minutes per scan.
Support for even larger formats is also available upon request.
Feature
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Desktop-type inspection system with advanced line scan camera technology
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Uses the same inspection algorithms as inline systems for consistent results
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Ideal for laboratory use, development, and pre-inline evaluations
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Customizable stage supports wide films up to 1.5 meters in width
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TD distribution of wide films can be scanned and evaluated in approx. 5 minutes
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Compact footprint for easy setup on lab benches or production lines
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Optional support for films exceeding 1.5 meters – contact us for customization
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Simple operation with intuitive interface and easy data export
Specification
| Model Name | KAMAKIRI X-Stage |
| Main Applications | - Sampling inspection- Evaluation of development samples |
| Key Features |
1. Micro-scale strain evaluation 2. High correlation with STS system 3. Convertible to STS configuration |
| Measured Parameters | - Retardation- Principal axis orientation |
| Retardation Measurement Range | 0–260 nm |
| Retardation Repeatability | < ±1 nm Evaluated using standard phase elements under in-house conditions |
| Axis Orientation Measurement Range | 0–180° |
| Axis Orientation Repeatability | < ±1° When retardation exceeds 10 nm |
| Center Measurement Wavelength | 543 nm Other wavelengths available upon request |
| Number of Measurement Points | 424 |
| Software (JP/EN) | KAMAKIRI Inline Basic Software |
| Customization Examples | Proven customization for large X-stage (capable of 1-pass scan of 1500 mm-wide film) |
